Study of nonlinearity effects in simple circuits under pulsed conditions

The nonlinearities produced via RF direct injection in simple circuits comprised of diodes, transistors, and IC´s, when driven with multiple frequency inputs, is under investigation. The effects of different pulse durations and frequency of the RF pulse while investigating each device´s stability and nonlinear response will be reported. Previous tests have concluded that the response of these devices exhibit multiple nonlinear effects when given continuous multiple input frequency stimuli. Given the previous results, multiple injected pulse conditions are under test. In these experiments, pulse durations varying between 200ns to 1ms, and frequencies between 10MHz and 25MHz are being tested to determine the effect on each device´s response. The device considered will primarily consist of a common RF amplifier. The implementation of the test fixtures, laboratory equipment, and data analysis will be discussed along with the test results and conclusions.