Title :
Closed-Loop CMOS Gate Delay Time Optimization
Author :
Stockinger, Michael ; Selberherr, Siegfried
Author_Institution :
Vienna University of Technology, Austria
Keywords :
CMOS technology; Capacitance; Containers; Delay effects; Doping profiles; Inverters; Leakage current; MOSFETs; Microelectronics; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
