• DocumentCode
    1950315
  • Title

    Effect of pH on the capacitive behavior of microgap sensor

  • Author

    Humayun, Q. ; Hashim, U.

  • Author_Institution
    Nano Struct. Lab.-On-Chip Res. Group, Univ. Malaysia Perlis (UniMap), Kangar, Malaysia
  • fYear
    2012
  • fDate
    17-19 Dec. 2012
  • Firstpage
    383
  • Lastpage
    386
  • Abstract
    The current study demonstrates the fabrication and electrical characterization of aluminum micro-gap onto polysilicon substrate. Low cost conventional photolithography technique was used to fabricate the aluminum micro-gap. The fabricated device was tested for different pH values. In order to get the micro-gap structure, mask was design using AutoCAD software and due to because of low dimensions the designed mask was transferred on chrome glass to get chrome mask for better resolution. The size of the fabricated micro-gap was around 09μm. It was observed that when the pH value switches from acidic to basic (pH10 to pH6) the capacitance decreased from 290nF to 9nF. The change in capacitance suggested that the fabricated device can differentiate between acidic and basic pH values with marginal changes. Future work will focus to decrease the microgap size until reach to nanogap, such nanogap will be used for biosensing application by inserting biomolecule in between the nanogap.
  • Keywords
    capacitive sensors; chemical sensors; microsensors; nanosensors; pH measurement; AutoCAD software; acidic pH values; aluminum micro-gap; biosensing application; capacitive behavior; chrome glass; electrical characterization; inserting biomolecule; low cost conventional photolithography technique; microgap sensor; pH effect; pH value switches; polysilicon substrate; biosensing; chrome mask; micro-gap; pH; photolithography capacitance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Engineering and Sciences (IECBES), 2012 IEEE EMBS Conference on
  • Conference_Location
    Langkawi
  • Print_ISBN
    978-1-4673-1664-4
  • Type

    conf

  • DOI
    10.1109/IECBES.2012.6498092
  • Filename
    6498092