DocumentCode
1950362
Title
The triggered behaviour of a controlled corona stabilised cascade switch
Author
Given, M.J. ; Wilson, M.P. ; Timoshkin, I.V. ; MacGregor, S.J. ; Wang, T. ; Lehr, J.M.
Author_Institution
Dept. Electron. & Electr. Eng., Univ. of Strathclyde, Glasgow, UK
fYear
2011
fDate
19-23 June 2011
Firstpage
1015
Lastpage
1020
Abstract
Corona stabilised switches have been shown to have advantages in pulse power switching applications due to their high repetition rates and low jitter. Work performed in recent years by the High Voltage Technologies Group within the Department of Electronic and Electrical Engineering at the University of Strathclyde has shown that the operating voltage range of such switches can be extended by using a multi-gap cascade configuration. One particular multi-gap topology was shown to operate under pressure at 100 kV with a switching jitter of ≈ 2ns. It has since been shown that by modifying the topology of the corona sources on the electrodes, it is possible to control the grading of the voltage distribution across the gaps in the cascade. The voltages across each gap and the self-break behaviour of the cascade were found to be in close agreement with the values predicted from the corona emission characteristics for the tested electrode topologies. This paper reports on a further examination of the behaviour of the corona controlled switching topology, where triggered operation of the switch has been investigated for different voltage distributions across the cascade gaps.
Keywords
corona; pulsed power switches; timing jitter; Department of Electronic and Electrical Engineering; High Voltage Technologies Group; University of Strathclyde; controlled corona; corona emission; corona stabilised switches; multigap cascade configuration; multigap topology; pulse power switching; stabilised cascade switch; switching jitter; triggered behaviour; voltage 100 kV; voltage distribution; Corona; Jitter; Lead; Limiting; Resistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference (PPC), 2011 IEEE
Conference_Location
Chicago, IL
ISSN
2158-4915
Print_ISBN
978-1-4577-0629-5
Type
conf
DOI
10.1109/PPC.2011.6191634
Filename
6191634
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