• DocumentCode
    1950441
  • Title

    Electrically conductive adhesive with π-conjugated self-assembled molecular wire junctions for enhanced electrical and thermal properties

  • Author

    Zhang, Rongwei ; Li, Yi ; Yim, Myung Jin ; Moon, Kyoung Sik ; Lu, Daoqiang Daniel ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    1913
  • Lastpage
    1918
  • Abstract
    Anisotropic conductive adhesives/films (ACAs/ACFs) have been developed as a promising lead-free interconnect material in the electronic industry. However, due to the restricted contact area and poor interfacial bonding between ACAs and metal bond pads, the ACA joints have lower electrical conductivity and poorer current carrying capability than that of solders. In this study, we investigated the current carrying capability of submicron-sized (~500 nm) silver (Ag) particles in ACA. It was found that the submicron-sized Ag particles have higher current carrying capability (~3400 mA) than micro-sized Au-coated polymer particles (~2000 mA) and Ag nanoparticles (~2500 mA). More importantly, with the introduction of self-assembled monolayer (SAM) on a Ag particle surface, the electrical conductivity and current carrying capability of the ACAs could be significantly improved. By studying the adsorption behavior and thermal stability of the SAMs on submicron-sized Ag particles with ATR FT-IR, Raman spectroscopy and TGA, the crucial factors that govern the improved electrical properties were discussed.
  • Keywords
    conductive adhesives; monolayers; self-assembly; silver; anisotropic conductive adhesive; anisotropic conductive film; electrically conductive adhesive; pi-conjugated self-assembled molecular wire junction; self-assembled monolayer; submicron-sized silver particle; Anisotropic conductive films; Anisotropic magnetoresistance; Bonding; Conducting materials; Conductive adhesives; Electronics industry; Environmentally friendly manufacturing techniques; Lead; Thermal conductivity; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550243
  • Filename
    4550243