Title :
2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)
Abstract :
The following topics were dealt with: microsystem technologies and devices; power devices and ICs; device physics and modeling; processes and characterization; device reliability and characterization; hybrid technologies and devices; circuit design and testing
Keywords :
integrated circuits; circuit design; circuit testing; device modeling; device reliability; hybrid technology; microelectronics; microsystem technology; power ICs; power devices;
Conference_Titel :
Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
Conference_Location :
Nis, Yugoslavia
Print_ISBN :
0-7803-5235-1
DOI :
10.1109/ICMEL.2000.838719
