Title :
Temperature Sensitivity of Devices and Circuits Fabricated in Fully Depleted Accumulation Mode Cmos/sol
Author :
Brady, F.T. ; Haddad, N.F. ; Wang, L.K. ; Miller, J.A. ; Seliskar, J.
Author_Institution :
IBM Federal Systems Company, Manassas, VA
Keywords :
CMOS technology; Circuit optimization; Degradation; Positron emission tomography; Random access memory; Temperature distribution; Temperature sensors; Thin film circuits; Thin film devices; Threshold voltage;
Conference_Titel :
SOI Conference, 1992. IEEE International
Conference_Location :
Ponte Vedra Beach, FL
Print_ISBN :
0-7803-7439-8
DOI :
10.1109/SOI.1992.664809