DocumentCode :
1951023
Title :
X-ray diagnostic development for measurement of electron deposition to the SABRE anode
Author :
Lash, J.S. ; Derzon, M.S. ; Cuneo, M.E. ; Vesey, R.A. ; Lazier, S.E.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
1997
fDate :
19-22 May 1997
Firstpage :
333
Lastpage :
334
Abstract :
Summary form only given. Extraction applied-B ion diodes are under development on the SABRE (6 MV, 250 kA) accelerator at Sandia. We are assessing this technology for the production of high brightness lithium ion beams for inertial confinement fusion. Electron loss physics is a focus of effort since electron sheath physics affects ion beam divergence, ion beam purity, and diode impedance. An X-ray slit-imaging diagnostic is under development for detection of X-rays produced during electron deposition to the anode. This diagnostic will aid in the correlation of electron deposition to ion production to better understand the ion diode physics. The X-ray detector consists of a filter pack, scintillator and optical fiber array that is streaked onto a CCD camera. Current orientation of the diagnostic provides spatial information across the anode radius at three different azimuths or at three different X-ray energy cuts. The observed X-ray emission spectrum can then be compared to current modeling efforts examining electron deposition to the anode.
Keywords :
X-ray emission spectra; anodes; beam handling techniques; diodes; electron beam deposition; ion beams; ion sources; particle beam diagnostics; plasma inertial confinement; CCD camera; Li; SABRE accelerator; SABRE anode; X-ray detector; X-ray diagnostic development; X-ray emission spectra; X-ray energy cuts; X-ray slit-imaging diagnostic; anode radius; current orientation; diode impedance; electron deposition; electron loss physics; electron sheath physics; extraction applied-B ion diodes; filter pack; inertial confinement fusion; ion beam divergence; ion beam purity; ion diode physics; ion production; optical fiber array; scintillator; spatial information; Anodes; Brightness; Diodes; Electron beams; Ion accelerators; Ion beams; Optical arrays; Physics; Production; X-ray detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location :
San Diego, CA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-3990-8
Type :
conf
DOI :
10.1109/PLASMA.1997.605250
Filename :
605250
Link To Document :
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