DocumentCode :
1952116
Title :
A worst-case circuit delay verification technique considering power grid voltage variations
Author :
Kouroussis, Dionysios ; Ahmadi, Rubil ; Najm, Farid N.
Author_Institution :
Dept. of ECE, Toronto Univ., Ont., Canada
fYear :
2004
fDate :
20-23 June 2004
Firstpage :
157
Lastpage :
160
Abstract :
In the verification of VLSI circuit design, static timing analysis (STA) techniques allow a designer to calculate the timing of a circuit at different process corners, which only consider cases where all the supplies are low or high. This analysis may not be the true maximum delay of a circuit due to the neglect of mismatch between drivers and load. We propose a new methodology for timing analysis where we identify all the possible critical paths of a circuit using new timing models while integrating the aforementioned mismatch for the logic gates. Given then these critical paths we tie the supplies of the gates to physical power grids and re-analyze for the worst-case time delay. This re-analysis is posed as a sequence of optimization problems where the complete operation of the entire circuit is abstracted in terms of current constraints. We present our technique and report on the implementation results using benchmark circuits tied to a number of test-case power grids.
Keywords :
VLSI; circuit optimisation; delay circuits; integrated circuit design; logic gates; timing circuits; VLSI circuit design; benchmark circuits; circuit optimization; current constraints; logic gates; power grid voltage; static timing analysis; worst case circuit delay verification; worst case time delay; Circuit synthesis; Circuit testing; Delay; Driver circuits; Logic circuits; Logic gates; Power grids; Timing; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2004. NEWCAS 2004. The 2nd Annual IEEE Northeast Workshop on
Print_ISBN :
0-7803-8322-2
Type :
conf
DOI :
10.1109/NEWCAS.2004.1359046
Filename :
1359046
Link To Document :
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