Title :
A fully-integrated CMOS RF front-end for Wi-Fi and Bluetooth
Author :
Yoon, Ho-Kwon ; Ismail, Mohammed
Author_Institution :
Analog VLSI Lab., Ohio State Univ., Columbus, OH, USA
Abstract :
A fully-integrated CMOS RF front-end for ISM band applications is presented. The RF front-end is designed in a 0.18 μm RF CMOS technology and used in a zero-IF Wi-Fi (IEEE 802.11b WLAN) and low-IF Bluetooth receiver. The RF front-end provides dual gain mode, 25 dB or 15 dB, to alleviate the linearity requirements of the following stages such as analog baseband filters and variable-gain amplifiers. It also presents low noise figure and high linearity. Noise figure, IIP3, and IIP2 are 4.1 dB, -11.6 dBm, 43.2 dBm for high gain mode, and 10.1 dB, -3.5 dBm, 55.2 dBm for low gain mode, respectively. The power consumption of the RF front-end is significantly reduced by using zero-IF/low-IF receiver architectures and only 22.7 mW from a 1.8 V supply voltage. The corner frequency of the flicker noise is only 46 kHz. The bondpad and package parasitics are also taken into account for the design and simulation.
Keywords :
Bluetooth; CMOS integrated circuits; circuit simulation; integrated circuit design; low-power electronics; radio receivers; radiofrequency amplifiers; radiofrequency filters; radiofrequency integrated circuits; wireless LAN; 0.18 micron; 1.8 V; 15 dB; 22.7 mW; 25 dB; 4.1 dB; 46 kHz; CMOS RF front end design; IEEE 802.11b WLAN; ISM band applications; RF CMOS technology; analog baseband filters; bondpad parasitics; corner frequency; flicker noise; input second-order intercept point; input third-order intercept point; low IF Bluetooth receiver; low IF receiver architectures; noise figure; package parasitics; power consumption; variable gain amplifiers; zero IF Wi-Fi; zero IF receiver architectures; Baseband; Bluetooth; CMOS technology; Filters; Gain; Linearity; Noise figure; Radio frequency; Radiofrequency amplifiers; Wireless LAN;
Conference_Titel :
Circuits and Systems, 2004. NEWCAS 2004. The 2nd Annual IEEE Northeast Workshop on
Print_ISBN :
0-7803-8322-2
DOI :
10.1109/NEWCAS.2004.1359106