Title :
The role of the device-line measurement technique in the predictive microwave multiple-device oscillator design and optimisation process
Author_Institution :
Inst. of Telecommun. & Acoust., Tech. Univ. Wroclaw, Poland
Abstract :
The device-line measurement approach simplifies oscillator circuit analysis. In this paper, the role of this technique in non-traditional microwave multiple-device oscillator design and optimisation process has been described.
Keywords :
Gunn oscillators; IMPATT oscillators; circuit optimisation; microwave measurement; microwave oscillators; negative resistance circuits; device-line measurement technique; microwave multiple-device oscillator design; microwave oscillator optimisation process; negative resistance one-port oscillators; Circuits; Equations; Frequency; Impedance; Microwave devices; Microwave measurements; Microwave oscillators; Process design; Semiconductor process modeling; Steady-state;
Conference_Titel :
Microwaves, Radar and Wireless Communications, 2002. MIKON-2002. 14th International Conference on
Print_ISBN :
83-906662-5-1
DOI :
10.1109/MIKON.2002.1017853
