Title :
A sideband interrogation method for precise measurement of resonance frequency difference between interferometers
Author :
Liu, Qingwen ; Tokunaga, Tomochika ; He, Zuyuan
Author_Institution :
Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan
Abstract :
A novel sideband interrogation method was developed for precise measurement of resonance frequency difference between interferometers. Frequency resolution better than 29 kHz was experimentally demonstrated with a pair of fiber Fabry-Perot interferometers.
Keywords :
Fabry-Perot interferometers; fibre optic sensors; light interferometry; Fabry-Perot interferometers; frequency resolution; precise measurement; resonance frequency difference; sideband interrogation method; Amplitude modulation; Frequency measurement; Geophysical measurements; Optical fiber sensors; Resonant frequency; Strain;
Conference_Titel :
Optical Fiber Communication Conference and Exposition (OFC/NFOEC), 2012 and the National Fiber Optic Engineers Conference
Conference_Location :
Los Angeles, CA
Print_ISBN :
978-1-4673-0262-3
