Title :
Sb-heterostructure Millimeter-Wave Detectors with Improved Noise Performance
Author :
Su, N. ; Zhang, Z. ; Moyer, H.P. ; Rajavel, R.D. ; Schulman, J.N. ; Fay, P.
Author_Institution :
Notre Dame Univ., Notre Dame
Abstract :
Detailed characterization of the low-frequency noise performance of mm-wave Sb- heterostructure detectors and the implications for devices and systems are reported. The low-frequency noise as a function of temperature and bias was characterized. While the detectors exhibit only thermal noise at zero bias, the application of either external DC bias or the generation of a self-bias from incident RF power induces low-frequency noise. The low-frequency noise spectrum was measured as a function of applied bias.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; millimetre wave detectors; semiconductor device noise; thermal noise; Sb; external DC bias; incident RF power; low-frequency noise; mm-wave heterostructure millimeter-wave detectors; self-bias generation; thermal noise; Acoustical engineering; Bandwidth; Detectors; Low-frequency noise; Noise generators; Radio frequency; Temperature dependence; Temperature distribution; Temperature sensors; Thermal resistance;
Conference_Titel :
Device Research Conference, 2007 65th Annual
Conference_Location :
Notre Dame, IN
Print_ISBN :
978-1-4244-1101-6
Electronic_ISBN :
1548-3770
DOI :
10.1109/DRC.2007.4373693