DocumentCode :
1959174
Title :
Potential measurement of evanescent-field-induced radiation pressure
Author :
Sasaki, K. ; Wada, K.-i. ; Masuhara, H.
Author_Institution :
Dept. of Appl. Phys., Osaka Univ., Japan
fYear :
1998
fDate :
8-8 May 1998
Firstpage :
160
Abstract :
Summary form only given. It has been reported that microparticles could be driven and aligned by an evanescent field induced at solid-liquid interfaces, based on radiation pressure caused by photon momentum transfer from the localized optical field to the particles. For its applications to micromanipulation and micropatterning of particles, it is indispensable to quantitatively measure the strength and potential energy of the evanescent-field-induced radiation pressure. In this paper, we describe the direct observation of three-dimensional interaction potential between a single particle and the localized optical field. A microparticle was irradiated with the evanescent field of a Nd:YAG laser.
Keywords :
laser beam effects; micromanipulators; micropositioning; radiation pressure; Nd:YAG laser; YAG:Nd; YAl5O12:Nd; evanescent field; evanescent-field-induced radiation pressure; localized optical field; micromanipulation; microparticles; micropatterning; photon momentum transfer; radiation pressure; single particle; solid-liquid interfaces; three-dimensional interaction potential; Energy measurement; Laser beams; Optical microscopy; Optical polarization; Optical retarders; Optical scattering; Optical surface waves; Particle measurements; Potential energy; Pressure measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics Conference, 1998. IQEC 98. Technical Digest. Summaries of papers presented at the International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-541-2
Type :
conf
DOI :
10.1109/IQEC.1998.680331
Filename :
680331
Link To Document :
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