Title :
Surface Examination using a Superresolution Scanning Microwave Microscope
Author :
Ash, E.A. ; Husain, A.
Author_Institution :
Department of Electronic and Electrical Engineering, University College, London
Keywords :
Acoustic signal detection; Apertures; Detectors; Gratings; Microscopy; Nondestructive testing; Object detection; Phase detection; Signal resolution; Surface cracks;
Conference_Titel :
Microwave Conference, 1973. 3rd European
Conference_Location :
Brussels, Belgium
DOI :
10.1109/EUMA.1973.331765
