DocumentCode :
1959585
Title :
Comparison of SIE and VSIE for computation of EM scattering from large and complex structures
Author :
Lu, Cai-Cheng ; Luo, Chong
Volume :
3
fYear :
2002
fDate :
16-21 June 2002
Firstpage :
184
Keywords :
Coatings; Computational complexity; Convergence; Current; Dielectric materials; Differential equations; Electromagnetic scattering; Integral equations; Iterative algorithms; Large-scale systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2002. IEEE
Conference_Location :
San Antonio, TX, USA
Print_ISBN :
0-7803-7330-8
Type :
conf
DOI :
10.1109/APS.2002.1018186
Filename :
1018186
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1959585
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