DocumentCode
1961561
Title
A Rationale for Pursuing EIT and MREIT in 3-D Based on Weyl Asymptotics and Problem Conditioning
Author
Kotiuga, P. Robert
Author_Institution
Dept. of Electr. & Comput. Eng., Boston Univ., MA
fYear
0
fDate
0-0 0
Firstpage
162
Lastpage
162
Abstract
Weyl asymptotics are used to demonstrate that the conditioning of electrical impedance tomography improves with dimension. The analysis shows that the practical difficulties of collecting data in 3-d should not deter one from expecting good reconstructions
Keywords
electric impedance imaging; EIT; MREIT; Weyl asymptotics; electrical impedance tomography; magnetic resonance assisted EIT; problem conditioning; Boundary conditions; Conductivity; Conductors; Eigenvalues and eigenfunctions; Electromagnetic radiation; Image reconstruction; Impedance; Magnetic analysis; Neodymium; Tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Field Computation, 2006 12th Biennial IEEE Conference on
Conference_Location
Miami, FL
Print_ISBN
1-4244-0320-0
Type
conf
DOI
10.1109/CEFC-06.2006.1632954
Filename
1632954
Link To Document