• DocumentCode
    1962087
  • Title

    Sensitivity analysis of modular dynamic fault trees

  • Author

    Ou, Yong ; Dugan, Joanne Bechta

  • Author_Institution
    Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    35
  • Lastpage
    43
  • Abstract
    Dynamic fault tree analysis, as currently supported by the Galileo software package, provides an effective means for assessing the reliability of embedded computer-based systems. Dynamic fault trees extend traditional fault trees by defining special gates to capture sequential and functional dependency characteristics. A modular approach to the solution of dynamic fault trees effectively applies Binary Decision Diagram (BOD) and Markov model solution techniques to different parts of the dynamic fault tree model. Reliability analysis of a computer-based system tells only part of the story, however. Follow-up questions such as “Where are the weak links in the system?”, “How do the results change if my input parameters change?“ and “What is the most cost effective way to improve reliability?” require a sensitivity analysis of the reliability analysis. Sensitivity analysis (often called Importance Analysis) is not a new concept, but the calculation of sensitivity measures within the modular solution methodology for dynamic and static fault trees raises some interesting issues. In this paper we address several of these issues, and present a modular technique for evaluating sensitivity, a single traversal solution to sensitivity analysis for BOD, a simplified methodology for estimating sensitivity for Markov models, and a discussion of the use of sensitivity measures in system design. The sensitivity measures for both the Binary Decision Diagram and Markov approach presented in this paper is implemented in Galileo, a software package for reliability analysis of complex computer-based systems
  • Keywords
    Markov processes; binary decision diagrams; embedded systems; fault trees; performance evaluation; sensitivity analysis; software packages; Galileo software package; Markov model solution; binary decision diagram; complex computer-based systems; dynamic fault tree model; dynamic fault trees; embedded computer-based systems; fault trees; modular approach; modular dynamic fault trees; modular solution methodology; reliability; sensitivity analysis; Board of Directors; Boolean functions; Costs; Data structures; Embedded computing; Fault trees; Sensitivity analysis; Software measurement; Software packages; System analysis and design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Performance and Dependability Symposium, 2000. IPDS 2000. Proceedings. IEEE International
  • Conference_Location
    Chicago, IL
  • ISSN
    1087-2191
  • Print_ISBN
    0-7695-0553-8
  • Type

    conf

  • DOI
    10.1109/IPDS.2000.839462
  • Filename
    839462