DocumentCode
1962095
Title
Multiparameter Electronics Systems Control Probabilistic Evaluation
Author
Eidukas, Danielius ; Kalnius, Rimantas
Author_Institution
Dept. of Electron. Eng., Kaunas Univ. of Technol., Kaunas, Lithuania
fYear
2009
fDate
11-16 Oct. 2009
Firstpage
105
Lastpage
108
Abstract
This publication is about continuous operational control main probabilities characteristics modeling techniques for multilevel electronics systems. These are useful when separate independent parameters defect level probabilities distributions are set (known) for chosen (selected) control schematics place. Denied electronics systems streams goes back to production process for regeneration and electronics systems classification rules in different control levels are similar, when electronics system classification first and second type errors are not denied by different parameters (good is denied or bad is accepted as good). Offered to use approximated models instead of exact whole electronics system defect level probabilities density transformed models because of complicated process of integration.
Keywords
control systems; electronics industry; integrated circuit manufacture; probability; semiconductor process modelling; classification first type errors; classification rules; classification second type errors; continuous operational control; control probabilistic evaluation; control schematics place; defect level probability density transformed model; defect level probability distributions; integration process; multilevel electronics systems; multiparameter electronics systems; Control system analysis; Control system synthesis; Control systems; Databases; Distribution functions; Manufacturing processes; Probability; Production systems; Quality control; Stochastic processes; electronics systems; probabilistic evaluation; probabilities density;
fLanguage
English
Publisher
ieee
Conference_Titel
Advances in Circuits, Electronics and Micro-electronics, 2009. CENICS '09. Second International Conference on
Conference_Location
Sliema
Print_ISBN
978-0-7695-3832-7
Type
conf
DOI
10.1109/CENICS.2009.26
Filename
5291490
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