Title :
Pull-in Analysis of Scanners Actuated by Electrostatic Vertical Combdrives
Author :
Lee, Daesung ; Solgaard, Olav
Author_Institution :
Stanford Univ., Stanford
fDate :
Aug. 12 2007-July 16 2007
Abstract :
This paper presents an analysis of pull-in due to in-plane twist in MEMS scanners actuated by vertical combdrives with general comb gap arrangements and cross-sections. The analysis is based on a 2-DOF actuator with a single voltage control. A closed-form pull-in deflection angle expression is obtained by accurately modeling the capacitance between the movable and fixed combs. The analysis results are in good agreement with simulations, and allow optimization of scanner designs by combining pull-in deflection angle, capacitance maximum angle, and available torque.
Keywords :
actuators; micro-optics; micromechanical devices; optical scanners; MEMS scanners; capacitance maximum angle; closed-form pull-in deflection angle; electrostatic vertical combdrives; general comb gap arrangement; in-plane twist; Actuators; Capacitance; Electrostatic analysis; Equations; Fasteners; Laboratories; Micromechanical devices; Springs; Torque; Voltage control; Pull-in; comb gap; in-plane twist; scanner; vertical combdrive;
Conference_Titel :
Optical MEMS and Nanophotonics, 2007 IEEE/LEOS International Conference on
Conference_Location :
Hualien
Print_ISBN :
978-1-4244-0641-8
DOI :
10.1109/OMEMS.2007.4373852