Title :
Simplified Approach to Sensitivity Optimization by Use of Scattering Parameters
Author :
Rauscher, C. ; Epprecht, G.
Author_Institution :
Microwave Laboratory of the Fed.Inst.of Techn., 8006 Zurich, Switzerland
Abstract :
The optimal immunization of a microwave network against parameter tolerances can be achieved more simply than by a "worst case" approach if certain sacrifices in final conclusiveness are accepted. The paper describes such a simplified procedure and discusses some practical aspects of its use. The crux of the procedure lies in the proposed efficient method for the calculation of large-change scattering parameter sensitivities.
Keywords :
Frequency; Gradient methods; Microwave circuits; Optimization methods; Scattering parameters; Yttrium;
Conference_Titel :
Microwave Conference, 1974. 4th European
Conference_Location :
Montreux, Switzerland
DOI :
10.1109/EUMA.1974.332080
