DocumentCode
1965180
Title
Hot Electrons Microwave Power Monitors for X and S-Bands
Author
Konopka, J.
Author_Institution
Instysut Fizyki PAN, Al. Lotnikow 32/44, 02-668 warszawa, POLAND
fYear
1975
fDate
1-4 Sept. 1975
Firstpage
89
Lastpage
94
Abstract
Design and performance of very high pulse power monitors based on the thermoelectric effects of hot carriers in a semiconductor placed in the microwave electric field gradient is described. Principle of operation of the devices is presented with the special attention paid to semiconductor material choice and some particular design problems. The results of measurements of S and X-band power monitors are given up to 1 MW and 100 KW respectively. Thermoelectric voltage of hot carriers is not sensitive to ambient temperature changes from - 40 to + 60°C. No aging effects during 6 month period were detected.
Keywords
Charge carrier processes; Distribution functions; Electrons; Hot carriers; Lattices; Power measurement; Power system reliability; Probes; Semiconductor waveguides; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1975. 5th European
Conference_Location
Hamburg, Germany
Type
conf
DOI
10.1109/EUMA.1975.332159
Filename
4130788
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