• DocumentCode
    1965484
  • Title

    Mechanism of interaction between electric arc and breaking chamber in low voltage current limiting circuit breakers

  • Author

    Abri, A. ; Kjellnäs, S. ; Nordgren, R. ; Lindgren, S. ; Banghammar, L.

  • Author_Institution
    ABB Distribution AB, Vasteras, Sweden
  • fYear
    1989
  • fDate
    1-5 Oct. 1989
  • Firstpage
    1895
  • Abstract
    The authors survey different types of contact arrangements with simple, double, and quadruple arc interruption in current-limiting, low-voltage, protective switching devices. The influence of the arc commutation from moving contact arm to commutation bar is discussed. A rapid electromagnet with a rotating armature is introduced. The performance of the electromagnet has been investigated by the finite-element method. The same method is used to study the configuration of the arcing chamber and the influence of different parameters on the contact repulsion forces. The experiments have been carried out using a capacitor bank. It is shown that the motion of the contact arm and the magnetic blast of the arc, its elongation, and its commutation have to be coordinated in such a way that the device functions over the entire fault current region. A sophisticated breaking chamber is needed to obtain a high short-circuit interrupting capacity within a given geometry. A good arcing process is the one that displaces the ´thermal conflict´ between the arc and the other elements of the chamber from the contact area to the deionization plate package.<>
  • Keywords
    circuit breakers; circuit-breaking arcs; electromagnets; finite element analysis; arc commutation; arc interruption; breaking chamber; capacitor bank; contact arrangements; contact repulsion forces; deionization plate package; electric arc; electromagnet; fault current; finite-element method; low voltage current limiting circuit breakers; magnetic blast; power system protection; rotating armature; short-circuit; Capacitors; Circuit testing; Commutation; Current limiters; Electromagnets; Fault currents; Low voltage; Mirrors; Pulse generation; Switchgear;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 1989., Conference Record of the 1989 IEEE
  • Conference_Location
    San Diego, CA, USA
  • Type

    conf

  • DOI
    10.1109/IAS.1989.96898
  • Filename
    96898