Title :
Security risk analysis of RFID technology: A RFID tag life cycle approach
Author :
Khoo, Benjamin ; Harris, Peter ; Husain, Syed Abbas
Author_Institution :
Sch. of Manage., New York Inst. of Technol., Old Westbury, NY
Abstract :
Most of the sources of security and privacy issues in RFID technology arise from the violation of the air interface between a tag and its reader. This paper will approach the security risk analysis process from the perspective of the RFID tag life cycle, identify the tag usage processes, identify the associated vulnerability and threat to the confidentiality, integrity and availability of the information assets and its implications for privacy, and then mitigate the risks.
Keywords :
data privacy; radiofrequency identification; risk analysis; security of data; RFID tag life cycle approach; RFID technology; air interface; data privacy; information assets; privacy issues; risk mitigation; security issues; security risk analysis; tag usage process; Communications technology; Cultural differences; Global communication; Mediation; Paper technology; RFID tags; Radio broadcasting; Radiofrequency identification; Risk analysis; Security;
Conference_Titel :
Wireless Telecommunications Symposium, 2009. WTS 2009
Conference_Location :
Prague
Print_ISBN :
978-1-4244-2588-4
Electronic_ISBN :
1934-5070
DOI :
10.1109/WTS.2009.5068991
