DocumentCode
1966349
Title
Diamond Materials for GaN HEMT near Junction Heat Removal
Author
Sandhu, Rajinder ; Gambin, Vincent ; Poust, Benjamin ; Smorchkova, Ioulia ; Lewis, Gregg ; Elmadjian, Raffi ; Li, Danny ; Geiger, Craig ; Heying, Ben ; Wojtowicz, Mike ; Oki, Aaron ; Feygelson, Tatyana ; Hobart, Karl ; Bozorg-Grayeli, Elah ; Goodson, Kenn
Author_Institution
Northrop Grumman Aerosp. Syst., Redondo Beach, CA, USA
fYear
2012
fDate
14-17 Oct. 2012
Firstpage
1
Lastpage
1
Abstract
Summary form only given. GaN HEMT technology is transforming applications in communications, radar, and electronic warfare by offering more than 5x higher RF transmit power over the existing GaAs-based technologies. The high breakdown voltage and current handling capability of GaN HEMTs enables, for the same device size, a 10x increase in RF power using GaN-based devices in place of conventional GaAs-based devices. However the ultimate power and performance of GaN technology cannot be exploited in real applications due to thermal limitations on performance and reliability. The high power density in GaN HEMTs translates to mega-Watts/cm2 heat dissipation at the device gate region. Increasing the heat conductance near the GaN device junction is critical to reduce device junction temperature for reliable operation and performance. NGAS will report on revolutionary methods being developed to directly integrate high quality, high thermal conductivity diamond materials with more than 4x greater thermal conductivity over existing state-of-the-art GaN HEMT technology.
Keywords
III-V semiconductors; cooling; diamond; gallium compounds; high electron mobility transistors; semiconductor device reliability; thermal conductivity; wide band gap semiconductors; C; GaN; HEMT near junction heat removal technology; RF transmit power; current handling capability; device gate region; device junction temperature; electronic warfare; heat conductance; heat dissipation; high breakdown voltage; high power density; high thermal conductivity diamond materials; radar; reliability; Conductivity; Diamond-like carbon; Films; Gallium nitride; HEMTs; Junctions; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Compound Semiconductor Integrated Circuit Symposium (CSICS), 2012 IEEE
Conference_Location
La Jolla, CA
ISSN
1550-8781
Print_ISBN
978-1-4673-0928-8
Type
conf
DOI
10.1109/CSICS.2012.6340119
Filename
6340119
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