• DocumentCode
    1966349
  • Title

    Diamond Materials for GaN HEMT near Junction Heat Removal

  • Author

    Sandhu, Rajinder ; Gambin, Vincent ; Poust, Benjamin ; Smorchkova, Ioulia ; Lewis, Gregg ; Elmadjian, Raffi ; Li, Danny ; Geiger, Craig ; Heying, Ben ; Wojtowicz, Mike ; Oki, Aaron ; Feygelson, Tatyana ; Hobart, Karl ; Bozorg-Grayeli, Elah ; Goodson, Kenn

  • Author_Institution
    Northrop Grumman Aerosp. Syst., Redondo Beach, CA, USA
  • fYear
    2012
  • fDate
    14-17 Oct. 2012
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. GaN HEMT technology is transforming applications in communications, radar, and electronic warfare by offering more than 5x higher RF transmit power over the existing GaAs-based technologies. The high breakdown voltage and current handling capability of GaN HEMTs enables, for the same device size, a 10x increase in RF power using GaN-based devices in place of conventional GaAs-based devices. However the ultimate power and performance of GaN technology cannot be exploited in real applications due to thermal limitations on performance and reliability. The high power density in GaN HEMTs translates to mega-Watts/cm2 heat dissipation at the device gate region. Increasing the heat conductance near the GaN device junction is critical to reduce device junction temperature for reliable operation and performance. NGAS will report on revolutionary methods being developed to directly integrate high quality, high thermal conductivity diamond materials with more than 4x greater thermal conductivity over existing state-of-the-art GaN HEMT technology.
  • Keywords
    III-V semiconductors; cooling; diamond; gallium compounds; high electron mobility transistors; semiconductor device reliability; thermal conductivity; wide band gap semiconductors; C; GaN; HEMT near junction heat removal technology; RF transmit power; current handling capability; device gate region; device junction temperature; electronic warfare; heat conductance; heat dissipation; high breakdown voltage; high power density; high thermal conductivity diamond materials; radar; reliability; Conductivity; Diamond-like carbon; Films; Gallium nitride; HEMTs; Junctions; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductor Integrated Circuit Symposium (CSICS), 2012 IEEE
  • Conference_Location
    La Jolla, CA
  • ISSN
    1550-8781
  • Print_ISBN
    978-1-4673-0928-8
  • Type

    conf

  • DOI
    10.1109/CSICS.2012.6340119
  • Filename
    6340119