DocumentCode
1967151
Title
Delivering on obsolescence protection
Author
Wubbena, Hob
Author_Institution
Agilent Technol., Loveland
fYear
2007
fDate
17-20 Sept. 2007
Firstpage
517
Lastpage
522
Abstract
With the growing need to reduce operational costs, many aerospace and defense companies are focusing on lowering the overall lifecycle costs of test platforms. The difficulty of this challenge is often compounded by the need to sustain test systems over the multi-decade life of the supported platform - a requirement that typically increases the long-term maintenance costs of an aging automated test system (ATS). In many cases, the shortcomings of existing test system architectures contribute to the problem. An alternative approach, already in use, addresses those shortcomings through an efficient, interactive platform for creating flexible system frameworks. This platform simplifies the process of replacing discontinued instruments with either similar devices or alternatives such as modular instruments or abstract instruments. Most test-system architectures typically require standardized hardware, software, instrument interfaces or communication protocols. In contrast, the "managed integration" alternative uses a services-based approach to enable inclusion of wide-ranging languages, drivers, interfaces, protocols, test executives and instrument types into hybrid systems that easily combine new and existing elements. To mitigate instrument or software obsolescence, this services-based platform completely decouples the hardware and software. This allows component connections to be configured (e.g., created and deleted) at runtime via subscription without compilation, linking, or pausing of the system. Thus, when an instrument must be replaced, it can be hot-swapped by changing the connections even if its predecessor used a different communication protocol.
Keywords
automatic test equipment; automatic test software; cost reduction; life cycle costing; abstract instruments; aging automated test system; flexible system frameworks; hybrid systems; instrument obsolescence; interactive platform; long-term maintenance costs; managed integration alternative; modular instruments; obsolescence protection; overall lifecycle costs; services-based approach; services-based platform; software obsolescence; test platforms; test systems; Aerospace testing; Aging; Automatic testing; Costs; Hardware; Instruments; Life testing; Protection; Protocols; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Autotestcon, 2007 IEEE
Conference_Location
Baltimore, MD
ISSN
1088-7725
Print_ISBN
978-1-4244-1239-6
Electronic_ISBN
1088-7725
Type
conf
DOI
10.1109/AUTEST.2007.4374262
Filename
4374262
Link To Document