• DocumentCode
    1967151
  • Title

    Delivering on obsolescence protection

  • Author

    Wubbena, Hob

  • Author_Institution
    Agilent Technol., Loveland
  • fYear
    2007
  • fDate
    17-20 Sept. 2007
  • Firstpage
    517
  • Lastpage
    522
  • Abstract
    With the growing need to reduce operational costs, many aerospace and defense companies are focusing on lowering the overall lifecycle costs of test platforms. The difficulty of this challenge is often compounded by the need to sustain test systems over the multi-decade life of the supported platform - a requirement that typically increases the long-term maintenance costs of an aging automated test system (ATS). In many cases, the shortcomings of existing test system architectures contribute to the problem. An alternative approach, already in use, addresses those shortcomings through an efficient, interactive platform for creating flexible system frameworks. This platform simplifies the process of replacing discontinued instruments with either similar devices or alternatives such as modular instruments or abstract instruments. Most test-system architectures typically require standardized hardware, software, instrument interfaces or communication protocols. In contrast, the "managed integration" alternative uses a services-based approach to enable inclusion of wide-ranging languages, drivers, interfaces, protocols, test executives and instrument types into hybrid systems that easily combine new and existing elements. To mitigate instrument or software obsolescence, this services-based platform completely decouples the hardware and software. This allows component connections to be configured (e.g., created and deleted) at runtime via subscription without compilation, linking, or pausing of the system. Thus, when an instrument must be replaced, it can be hot-swapped by changing the connections even if its predecessor used a different communication protocol.
  • Keywords
    automatic test equipment; automatic test software; cost reduction; life cycle costing; abstract instruments; aging automated test system; flexible system frameworks; hybrid systems; instrument obsolescence; interactive platform; long-term maintenance costs; managed integration alternative; modular instruments; obsolescence protection; overall lifecycle costs; services-based approach; services-based platform; software obsolescence; test platforms; test systems; Aerospace testing; Aging; Automatic testing; Costs; Hardware; Instruments; Life testing; Protection; Protocols; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2007 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-1239-6
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2007.4374262
  • Filename
    4374262