DocumentCode
1967176
Title
Instrumentation and standards for testing static control materials
Author
Chubb, John N.
Author_Institution
John Chubb Instrum., Cheltenham, UK
fYear
1989
fDate
1-5 Oct. 1989
Firstpage
1948
Abstract
The design, operation, and performance capabilities of an instrument that assesses insulating and semi-insulating materials by measuring of static charge decay are described. A patch of charge is deposited on the surface, and a fast-response electrostatic fieldmeter is used for direct, noncontact observation of the rate of charge dissipation. Comments are made on a proposed IEC standard incorporating the above method for assessing insulating materials. It is proposed that materials used in proximity to sensitive semiconductors should be of the static dissipative type with decay time constants at surface potentials in the 50 to 100 V range between 10 and 500 ms. The shortest decay time avoids the risk of spark-type electrical discharges to the surface, and the longer time is adequately short compared to normal manual actions likely to be involved in triboelectric charging. Examples of decay curves are given.<>
Keywords
electric breakdown; electrostatic discharge; instrumentation; insulation testing; standards; static electrification; 10 to 500 ms; 50 to 100 V; ESD; charge dissipation; decay time constants; electric breakdown; electrical discharges; electrostatic fieldmeter; instrumentation; insulating materials; insulation testing; semi-insulating materials; standards; static charge decay; static control materials; surface potentials; triboelectric charging; Charge measurement; Current measurement; Electrostatic measurements; IEC standards; Instruments; Insulation; Materials testing; Semiconductor materials; Surface charging; Surface discharges;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting, 1989., Conference Record of the 1989 IEEE
Conference_Location
San Diego, CA, USA
Type
conf
DOI
10.1109/IAS.1989.96906
Filename
96906
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