• DocumentCode
    1967285
  • Title

    BER performance comparison between CDMA and UWB for RF/wireless interconnect application

  • Author

    Rahaman, Md Sajjad ; Chowdhury, Masud H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Chicago, IL
  • fYear
    2008
  • fDate
    18-20 May 2008
  • Firstpage
    494
  • Lastpage
    497
  • Abstract
    In ultra large-scale integrated (ULSI) circuits conventional approaches of hard-wired metal interconnects are encountering fundamental limits. In order to get beyond this problem different revolutionary interconnect approaches have been explored. One of the most feasible approaches is RF/wireless interconnects, which are based on low-loss and dispersion-free microwave signal transmissions, near-field capacitive coupling and modern multiple-access technologies like code division multiple access (CDMA), frequency domain multiple access (FDMA), time domain multiple access (TDMA), ultrawideband (UWB) etc. In this paper BER performance of multi-carrier CDMA (MC-CDMA) and UWB transceiver for RF/wireless interconnect system are compared. Besides, required electronic overhead for these two transceivers is also mentioned.
  • Keywords
    ULSI; code division multiple access; error statistics; integrated circuit interconnections; radiofrequency integrated circuits; transceivers; ultra wideband communication; BER performance; CDMA; RF-wireless interconnection; ULSI; UWB; bit error rate; code division multiple access; ultra large-scale integrated circuit; ultrawideband transceiver; Bit error rate; Coupling circuits; Frequency domain analysis; Integrated circuit interconnections; Microwave technology; Multiaccess communication; RF signals; Radio frequency; Transceivers; Ultra large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro/Information Technology, 2008. EIT 2008. IEEE International Conference on
  • Conference_Location
    Ames, IA
  • Print_ISBN
    978-1-4244-2029-2
  • Electronic_ISBN
    978-1-4244-2030-8
  • Type

    conf

  • DOI
    10.1109/EIT.2008.4554353
  • Filename
    4554353