DocumentCode
1968060
Title
Delay variability: sources, impacts and trends
Author
Nassif, S.
Author_Institution
IBM Corp., Austin, TX, USA
fYear
2000
fDate
9-9 Feb. 2000
Firstpage
368
Lastpage
369
Abstract
The electrical performance of an integrated circuit is impacted by (a) environmental factors which include variations in power supply voltage and temperature, and(b) physical factors caused by processing and mask imperfections. Only the physical sources of variability, denoted P, are dealt with. P includes device and wire model parameters such as V/sub th/, T/sub ox/ and R/sub s/.
Keywords
delays; integrated circuit design; integrated circuit modelling; masks; wiring; IC design; delay variability; device model parameters; mask imperfections; physical factors; processing imperfections; wire model parameters; Circuit noise; Circuit simulation; Delay; Environmental factors; Power supplies; Semiconductor device modeling; Semiconductor device noise; Temperature; Voltage; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2000. Digest of Technical Papers. ISSCC. 2000 IEEE International
Conference_Location
San Francisco, CA, USA
ISSN
0193-6530
Print_ISBN
0-7803-5853-8
Type
conf
DOI
10.1109/ISSCC.2000.839819
Filename
839819
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