DocumentCode
1968394
Title
Ultrahigh-brightness microbeams: considerations for their generation and relevance to FEL
Author
Ishizuka, H. ; Nakahara, Y. ; Kawasaki, S. ; Sakamoto, K. ; Watanabe, A. ; Ogiwara, N. ; Shiho, M.
Author_Institution
Fukuoka Inst. of Technol., Japan
fYear
1993
fDate
17-20 May 1993
Firstpage
1566
Abstract
Field-emission tips have always been the brightest electron source, but the focused beam current from them has been very low. A substantial improvement in beam intensity and brightness is expected with the use of a microfabricated gated-emitter which produces a parallel beam near the emitter. A high-gradient accelerating field suppresses large displacement of electrons from the beam axis and thus reduces the emittance growth due to aberration. The emission is typically 100 μA per tip, while higher currents are generated by tightly-packed arrays of the gated-emitters. The attainable normalized brightness is estimated to exceed 1013 A/m2rad2, and such beams have unique uses for extending the laser wavelength to the X-ray region at moderate beam energies
Keywords
electron field emission; free electron lasers; laser beams; 100 muA; FEL; brightness; emittance growth; field-emission tips; free electron laser; gated-emitter; microbeams; Acceleration; Atomic beams; Brightness; Current density; Electron beams; Electron emission; Equations; Laser beams; Particle beams; X-ray lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 1993., Proceedings of the 1993
Conference_Location
Washington, DC
Print_ISBN
0-7803-1203-1
Type
conf
DOI
10.1109/PAC.1993.309072
Filename
309072
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