مرکز منطقه ای اطلاع رساني علوم و فناوري - Evaluation of Soft Errors in DRAM and SRAM using Nuclear Microprobe and Neutron Source

DocumentCode :

1969867

Title :

Evaluation of Soft Errors in DRAM and SRAM using Nuclear Microprobe and Neutron Source

Author :

Takay, M. ; Arita, Y. ; Abo, S. ; Iwamatsu, T. ; Maegawa, S. ; Sayama, H. ; Yamaguchi, Y. ; Inuishi, M. ; Nishimura, T.

Author_Institution :

Osaka University, Japan

fYear :

2001

fDate :

11-13 September 2001

Firstpage :

Lastpage :

Keywords :

Neutrons; Random access memory;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Solid-State Device Research Conference, 2001. Proceeding of the 31st European

Print_ISBN :

2-914601-01-8

Type :

conf

DOI :

10.1109/ESSDERC.2001.195199

Filename :

1506581

Link To Document :