Title :
Reuse of existing resources for analog BIST of a switch capacitor filter
Author :
Cota, Erika ; Carro, Luigi ; Renovell, Michel ; Lubaszewski, Marcelo ; Azaïs, Florence ; Bertrand, Yves
Author_Institution :
DELET, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
The objective of this paper is to discuss the possibility of reusing the existing hardware originally present in an analog application to implement test functions for a completely autonomous self-testable solution. In this first approach, a 8th order analog linear filter is used as an application example. The required modifications in the circuit are presented with the results in terms of area overhead and fault coverage
Keywords :
analogue integrated circuits; built-in self test; integrated circuit testing; switched capacitor filters; SC filter; analog BIST; analog linear filter; area overhead; fault coverage; resources reuse; switched capacitor filter; test functions; Automatic testing; Built-in self-test; Capacitors; Circuit faults; Circuit testing; Hardware; Nonlinear filters; Signal generators; Switches; Test equipment;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-0537-6
DOI :
10.1109/DATE.2000.840043
