DocumentCode :
1970428
Title :
Packaging and interconnect design and analysis using FDTD
Author :
Piket-May, Melinda ; Thomas, Kevin ; Gravrok, Roger
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
fYear :
1997
fDate :
27-29 Oct. 1997
Firstpage :
87
Lastpage :
90
Abstract :
This paper presents information about the development of a versatile FDTD solver and explores design issues relevant to the packaging and interconnect design engineers. The EM analysis development is called "LC". It consists of a GUI interface with the ability to auto-mesh a graphically defined user geometry. A number of different excitations are possible, and the outputs can yield not only field data, but also voltages, currents, impedances, inductances, capacitances and fluxes. Further, both time and frequency-domain data are available on output. It also allows for 2-D visual simulations of the full 3-D problem being simulated during time-stepping. This is very useful in identifying problem areas with a particular design. Another very important and relevant feature of the LC tool is an interface to SPICE which will analyze a circuit based on FDTD field values linked to SPICE at each time step. The SPICE interface also generates output voltages and/or currents that modify the FDTD field values which are then used during the next FDTD time-step. Essentially LC is an integrated EM model editor, simulator, and analysis tool. It is composed of 100,000 lines of C and Fortran, uses OSF/Motif, and is portable to all commercial Unix platforms. Its companion batch simulator, FDTD, and plotting program, LCPlot, are also included in the executable distribution.
Keywords :
CAD; Maxwell equations; SPICE; electronic engineering computing; finite difference time-domain analysis; graphical user interfaces; integrated circuit interconnections; packaging; 2D visual simulations; 3D problem; EM analysis; FDTD solver; GUI interface; LC tool; LCPlot; OSF/Motif; SPICE interface; frequency-domain data; graphically defined user geometry; integrated EM analysis tool; interconnect analysis; interconnect design; packaging analysis; packaging design; time-domain data; Circuit simulation; Design engineering; Finite difference methods; Geometry; Graphical user interfaces; Integrated circuit interconnections; Packaging; SPICE; Time domain analysis; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 1997., IEEE 6th Topical Meeting on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-8649-3
Type :
conf
DOI :
10.1109/EPEP.1997.634045
Filename :
634045
Link To Document :
بازگشت