Title :
Junction leakage in advanced CMOS technologies
Author :
Dachs, C.J.J. ; Surdeanu, R. ; Guyot, D. ; Parlangeli, A. ; Ponomarev, Y.V. ; Stolk, P.A.
Author_Institution :
Philips Research, Leuven, Belgium
fDate :
11-13 September 2001
Keywords :
CMOS technology;
Conference_Titel :
Solid-State Device Research Conference, 2001. Proceeding of the 31st European
Print_ISBN :
2-914601-01-8
DOI :
10.1109/ESSDERC.2001.195229
