DocumentCode :
1970655
Title :
Stochastic modeling and performance evaluation for digital clock and data recovery circuits
Author :
Demir, Alper ; Feldmann, Peter
Author_Institution :
Bell Labs., Murray Hill, NJ, USA
fYear :
2000
fDate :
2000
Firstpage :
340
Lastpage :
344
Abstract :
Clock and data recovery circuits are essential components in communication systems. They directly influence the bit-error-rate performance of communication links. It is desirable to predict the rate of occasional detection errors and the loss of synchronization due to the non-ideal operation of such circuits. In high-speed data networks, the bit-error-rate specification on the system can be very stringent, i.e., 10-14. It is not feasible to predict such error rates with straightforward, simulation based, approaches. This work introduces a stochastic model and an efficient, analysis-based, non-Monte-Carlo method for performance evaluation of digital data and clock recovery circuits. The analyzed circuit is modeled as finite state machines with inputs described as functions on a Markov chain state-space. System performance measures, such as probability of bit errors and rate of synchronization loss, can be evaluated through the analysis of a larger resulting Markov system. A dedicated multi-grid method is used to solve the very large associated linear systems. The method is illustrated on a real industrial clock-recovery circuit design
Keywords :
Markov processes; circuit simulation; differential equations; digital phase locked loops; finite state machines; state-space methods; synchronisation; Markov chain state-space; associated linear systems; bit errors; bit-error-rate performance; bit-error-rate specification; clock recovery circuits; data recovery circuits; dedicated multi-grid method; finite state machines; non-Monte-Carlo method; non-ideal operation; occasional detection errors; performance evaluation; rate of synchronization loss; stochastic model; stochastic modeling; synchronization; Automata; Circuit analysis; Circuit simulation; Clocks; Error analysis; Performance analysis; Predictive models; Stochastic processes; Synchronization; System performance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-0537-6
Type :
conf
DOI :
10.1109/DATE.2000.840293
Filename :
840293
Link To Document :
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