DocumentCode :
1970906
Title :
A Comparison Between 20:1 and 5:1 Doping Ratios for High Efficiency X-Band GaAs IMPATT Diodes
Author :
Huish, P.W.
Author_Institution :
PO Research Centre, Martlesham Heath, Ipswich, Suffolk, IP5 7RE England
fYear :
1977
fDate :
5-8 Sept. 1977
Firstpage :
487
Lastpage :
491
Abstract :
High efficiency X-band GaAs IMPATT diodes with doping ratios of 20:1 and 5:1 are compared using hybrid coaxial-waveguide circuits. Both doping ratios yield diodes which show a factor of two increase in output power and efficiency when compared with similar uniformly doped diodes. Arrays of diodes are used to obtain output powers up to 5W. The increase in output power is almost linearly related to the number of diodes forming the array. Measurements of the AMand FM noise of representative diodes show that no significant noise penalty is incurred by using either doping ratio. The more difficult fabrication technology associated with the 20:1 doping ratio is not commensurate with the increase in RF performance, and a lower doping ratio can be used to equal effect.
Keywords :
Circuits; Coaxial components; Diodes; Doping; Fabrication; Gallium arsenide; Noise measurement; Power generation; Radio frequency; Signal to noise ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1977. 7th European
Conference_Location :
Copenhagen, Denmark
Type :
conf
DOI :
10.1109/EUMA.1977.332472
Filename :
4131121
Link To Document :
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