DocumentCode :
1970917
Title :
Temperature and Humidity Measuring of a New Development Box Based on Expert PID
Author :
Ma Jiwei ; Lin Zhipeng ; Gao Jianli ; Ma Jimei ; Lin Hongju ; Liu Shiguang
Author_Institution :
Coll. of Mech. & Electr. Eng., Hebei Normal Univ. of Sci. & Technol., Qinhuangdao, China
fYear :
2010
fDate :
22-23 June 2010
Firstpage :
432
Lastpage :
435
Abstract :
This paper focuses on the hardware and software design method of a new type of high efficient temperature and humidity testing cabinet. As the hardware core is based on the STC12C5616AD MCU, the entire hardware system is simpler and more reliable. By using sectional measurement of temperature and humidity, adopting expert PID control algorithm and using hardware and software compensation measures, the system dynamic and static quality and control precision is further improved. The system cabinet with a unique inner and outer double-loop structure improves the system efficiency and energy saving effect. Furthermore, the use of touch screen as input and output device, which is simpler to operate and more eye-catching, meets the different needs of consumers.
Keywords :
control engineering computing; hardware-software codesign; humidity control; microcontrollers; temperature control; three-term control; touch sensitive screens; STC12C5616AD MCU; development box; double loop structure; expert PID control algorithm; hardware design method; humidity testing cabinet; software design method; temperature measurement; touch screen; Hardware; Humidity; Humidity measurement; Temperature control; Temperature measurement; Temperature sensors; STC12C5616AD; expert PID; sectional measurement; temperature and humidity; testing cabinet;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Computing and Cognitive Informatics (ICICCI), 2010 International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-6640-5
Electronic_ISBN :
978-1-4244-6641-2
Type :
conf
DOI :
10.1109/ICICCI.2010.98
Filename :
5565940
Link To Document :
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