DocumentCode
1971105
Title
Non-Contact PIM Measurement Method for Electrical Connection Inspection
Author
Kuga, Nobuhiro ; Ohnishi, Ken-ichi
Author_Institution
Fac. of Eng., Yokohama Nat. Univ., Yokohama
fYear
2007
fDate
11-14 Dec. 2007
Firstpage
1
Lastpage
4
Abstract
A non-contact inspection method using electromagnetic intermodulation is proposed for electrical connections. It uses heavy intermodulation, which occurs at the connection with high current density. In the proposed method, a small probe at the tip of semi-rigid coaxial line excites the DUT and detects the intermodulation signal via the near field, which is effective to achieve high spatial resolution. In this paper, a small monopole and a small loop are used as the probes and their capability are examined through the experiments. The evaluation result of a packaged substrate is also shown as an application. To evaluate the capability of the proposed technique, an electrical contact is used as a defected connection. As a sample of other kinds of noise sources, the sample containing a ferromagnetic material in part is also evaluated. The results show that the loop-probe wrapping around the DUT is effective to detect the PIM source even in a continuous material, and the monopole-probe is effective to evaluate electrical-connection failures.
Keywords
electrical contacts; inspection; intermodulation; electrical connection inspection; electrical connections; electrical-connection failures evaluation; electromagnetic intermodulation; monopole-probe; noncontact inspection method; noncontact passive intermodulation measurement method; Coaxial components; Contacts; Current density; Electric variables measurement; Electromagnetic measurements; Inspection; Packaging; Probes; Signal detection; Spatial resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2007. APMC 2007. Asia-Pacific
Conference_Location
Bangkok
Print_ISBN
978-1-4244-0748-4
Electronic_ISBN
978-1-4244-0749-1
Type
conf
DOI
10.1109/APMC.2007.4554558
Filename
4554558
Link To Document