DocumentCode
1973162
Title
Mechanisms and performance of metal oxide resistive RAM (RRAM)
Author
Chen, An ; Meneghini, Matteo ; Van Blerkom, Daniel ; Schanovsky, Franz ; Shaw, Tom
Author_Institution
Global Foundries
fYear
2013
fDate
13-17 Oct. 2013
Firstpage
187
Lastpage
189
Abstract
Resistive RAM (RRAM) has emerged as a promising nonvolatile memory solution. Significant progress has been made on RRAM fabrication and characterization, as well as the understanding of the physical mechanisms. There are large varieties of RRAM materials and devices. However, some common characteristics have been observed in these devices, which can be attributed to the RRAM switching mechanisms. This tutorial will review RRAM switching models, based on which RRAM properties and performance can be analyzed. Tradeoffs among key device parameters are important for realistic assessment of RRAM in potential application space. Reliability is considered a major challenge for RRAM devices. Issues in commonly used RRAM characterization techniques will also be discussed.
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International
Conference_Location
South Lake Tahoe, CA, USA
ISSN
1930-8841
Print_ISBN
978-1-4799-0350-4
Type
conf
DOI
10.1109/IIRW.2013.6804191
Filename
6804191
Link To Document