• DocumentCode
    1973162
  • Title

    Mechanisms and performance of metal oxide resistive RAM (RRAM)

  • Author

    Chen, An ; Meneghini, Matteo ; Van Blerkom, Daniel ; Schanovsky, Franz ; Shaw, Tom

  • Author_Institution
    Global Foundries
  • fYear
    2013
  • fDate
    13-17 Oct. 2013
  • Firstpage
    187
  • Lastpage
    189
  • Abstract
    Resistive RAM (RRAM) has emerged as a promising nonvolatile memory solution. Significant progress has been made on RRAM fabrication and characterization, as well as the understanding of the physical mechanisms. There are large varieties of RRAM materials and devices. However, some common characteristics have been observed in these devices, which can be attributed to the RRAM switching mechanisms. This tutorial will review RRAM switching models, based on which RRAM properties and performance can be analyzed. Tradeoffs among key device parameters are important for realistic assessment of RRAM in potential application space. Reliability is considered a major challenge for RRAM devices. Issues in commonly used RRAM characterization techniques will also be discussed.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International
  • Conference_Location
    South Lake Tahoe, CA, USA
  • ISSN
    1930-8841
  • Print_ISBN
    978-1-4799-0350-4
  • Type

    conf

  • DOI
    10.1109/IIRW.2013.6804191
  • Filename
    6804191