Model-Based Low-Noise Readout Integrated Circuit Design for Uncooled Microbolometers

Author

Jian Lv ; Hui Zhong ; Yun Zhou ; Baobin Liao ; Jun Wang ; Yadong Jiang

Author_Institution

State Key Lab. of Electron. Thin Film & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China

Volume

13

Issue

4

fYear

2013

fDate

Apr-13

Firstpage

1207

Lastpage

1215

Abstract

This paper presents a design model for uncooled microbolometers readout integrated circuits (ROIC). The relation between infrared focal-plane array (FPA) performance and ROIC design specification limits is shown distinctly. A simple way to find optimal operating conditions for a certain ROIC construction is also described. The signal and noise model of the ROIC is investigated in detail. A reasonable estimate of noise equivalent temperature differences for uncooled microbolometer detectors can be calculated with this model. A capacitor feedback transimpedance amplifier readout circuit is treated as an example. An experimental readout chip based on this model has been designed and implemented on silicon using a 0.5-μm CMOS technology. The temporal root mean square output noise voltage is 424 μV, which corresponds well with the measurement result. The result demonstrates the reliable prediction of achievable improvements for FPA by using this model.

Keywords

CMOS integrated circuits; bolometers; digital readout; equivalent circuits; focal planes; infrared detectors; microsensors; silicon; CMOS technology; NETD estimation; ROIC design specification; Si; focal plane array; infrared FPA; noise equivalent temperature difference; readout integrated circuit design; size 0.5 mum; uncooled microbolometer detector; voltage 424 muV; Bolometers; Detectors; Fluctuations; Integrated circuit modeling; Noise; Resistance; Thermal conductivity; Design optimization; microbolometer; noise; noise equivalent temperature difference (NETD); readout integrated circuit; responsivity;

fLanguage

English

Journal_Title

Sensors Journal, IEEE

Publisher

ieee

ISSN

1530-437X

Type

jour

DOI

10.1109/JSEN.2012.2230621

Filename

6415970