• DocumentCode
    19757
  • Title

    Follow-Up Multicenter Alpha Counting Comparison

  • Author

    Wilkinson, J.D. ; Clark, B.M. ; Wong, Rita ; Slayman, C. ; Gordon, Michael S. ; He, Yuhong ; Marckmann, J. ; McNally, B.D. ; Wu, Tsai-Fu

  • Author_Institution
    Medtronic Inc., Mounds View, MN, USA
  • Volume
    61
  • Issue
    4
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    1516
  • Lastpage
    1521
  • Abstract
    A follow-up alpha emissivity study was conducted to examine the wide variability observed in previous work that was hypothesized to be due to differences in the pulse height discrimination threshold among participant´s equipment. Two samples, one mixed energy and one monoenergetic, were prepared and sequentially circulated to all participants for counting. Analysis of the data demonstrates that only a small portion of the variability is explained by this mechanism. The role of the sample to entrance window gap for some counters was analyzed post hoc using the same data set and may be responsible for a large amount of the variability. The results of this large-scale study demonstrate the continuing uncertainty for these measurements and the importance of interpreting their results appropriately when estimating soft error rates.
  • Keywords
    alpha-particle detection; radiation hardening (electronics); alpha emissivity; entrance window gap; follow up multicenter alpha counting comparison; pulse height discrimination threshold; soft error rate; Alpha particles; Atmospheric measurements; Materials; Measurement uncertainty; Particle measurements; Radiation detectors; Uncertainty; Alpha particle; detectors; materials; reliability; single event upsets;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2014.2308956
  • Filename
    6820771