Title :
Complete In Situ Laser Monitoring of HgCdTe/CdTe/ZnTe Growth onto GaAs Substrates
Author :
Irvine, S.J.C. ; Bajaj, J. ; Sankur, H.O.
Author_Institution :
Rockwell International Corporation, CA
Keywords :
Gallium arsenide; Inductors; MOCVD; Monitoring; Morphology; Optical films; Optical materials; Reflectivity; Substrates; Zinc compounds;
Conference_Titel :
Metalorganic Vapor Phase Epitaxy, 1992. Sixth International Conference
Print_ISBN :
0-87942-652-7
DOI :
10.1109/MOVPE.1992.665006
