DocumentCode
1978360
Title
Transport behaviors of graphene 2D field-effect transistors on boron nitride substrate
Author
Alarcón, A. ; Nguyen, V. Hung ; Saint-Martin, J. ; Bournel, A. ; Dollfus, P.
Author_Institution
Inst. d´´ Electron. Fondamentale, Univ. Paris Sud, Orsay, France
fYear
2012
fDate
6-7 March 2012
Firstpage
57
Lastpage
60
Abstract
We present a numerical study of the transport behavior of a top-gate 2D-graphene field-effect transistor with boron nitride as substrate and gate insulator material. It is based on a non-equilibrium Green´s function approach to solving a tight-binding Hamiltonian of graphene, self-consistently coupled with 2D-Poisson´s equation. The analysis emphasizes the effects of the chiral character of carriers in graphene in the different conduction regimes, including Klein and band-to-band tunneling processes. We investigate the effects of gate length and gate insulator thickness, and the possible effect of BN-induced bandgap opening on the device characteristics, in particular in terms of on/off ratio, short-channel effect and saturation behavior, found to be in good agreement with experimental results. Additionally, the possibility of current oscillations and negative differential conductance typical of GFET is demonstrated.
Keywords
Green´s function methods; Poisson equation; boron compounds; field effect transistors; graphene; semiconductor device models; 2D-Poisson equation; BN-induced bandgap; GFET; Klein tunneling process; band-to-band tunneling process; boron nitride substrate; chiral character; conduction regime; current oscillation; gate insulator material; gate insulator thickness; gate length; graphene 2D field-effect transistor; negative differential conductance; nonequilibrium Green´s function approach; on-off ratio; saturation behavior; short-channel effect; transport behavior; Boron; Current density; Insulators; Logic gates; Photonic band gap; Substrates; Tunneling; GFET; Green´s function; chiral particles; graphene;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultimate Integration on Silicon (ULIS), 2012 13th International Conference on
Conference_Location
Grenoble
Print_ISBN
978-1-4673-0191-6
Electronic_ISBN
978-1-4673-0190-9
Type
conf
DOI
10.1109/ULIS.2012.6193356
Filename
6193356
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