DocumentCode
1978363
Title
Versatile march test generator for hands-on memory testing laboratory
Author
Galliere, J.-M. ; Dilillo, L.
Author_Institution
Polytech. Montpellier, Univ. of Montpellier, Montpellier, France
fYear
2011
fDate
5-6 June 2011
Firstpage
41
Lastpage
42
Abstract
Generally, in the studies of microelectronics engineer the approach of IC testing remains very theoretical. Only few concrete practices are commonly done and generally laboratory experiences are limited to the use of CAD tools. For this purpose, in our teaching department, we develop an experiment allowing a concrete learning of IC testing dedicated to the test of commercial memory chips. Through this environment, our students reached a better knowledge of the connection between the test sequences and the detected faults.
Keywords
SRAM chips; integrated circuit testing; CAD tools; IC testing; SRAM memory test bench; hands-on memory testing laboratory; memory chips; microelectronic engineer; versatile march test generator; Circuit faults; Education; Generators; Memory management; Microelectronics; Random access memory; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Systems Education (MSE), 2011 IEEE International Conference on
Conference_Location
San Diego, CA
Print_ISBN
978-1-4577-0548-9
Electronic_ISBN
978-1-4577-0550-2
Type
conf
DOI
10.1109/MSE.2011.5937088
Filename
5937088
Link To Document