• DocumentCode
    1978363
  • Title

    Versatile march test generator for hands-on memory testing laboratory

  • Author

    Galliere, J.-M. ; Dilillo, L.

  • Author_Institution
    Polytech. Montpellier, Univ. of Montpellier, Montpellier, France
  • fYear
    2011
  • fDate
    5-6 June 2011
  • Firstpage
    41
  • Lastpage
    42
  • Abstract
    Generally, in the studies of microelectronics engineer the approach of IC testing remains very theoretical. Only few concrete practices are commonly done and generally laboratory experiences are limited to the use of CAD tools. For this purpose, in our teaching department, we develop an experiment allowing a concrete learning of IC testing dedicated to the test of commercial memory chips. Through this environment, our students reached a better knowledge of the connection between the test sequences and the detected faults.
  • Keywords
    SRAM chips; integrated circuit testing; CAD tools; IC testing; SRAM memory test bench; hands-on memory testing laboratory; memory chips; microelectronic engineer; versatile march test generator; Circuit faults; Education; Generators; Memory management; Microelectronics; Random access memory; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Systems Education (MSE), 2011 IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4577-0548-9
  • Electronic_ISBN
    978-1-4577-0550-2
  • Type

    conf

  • DOI
    10.1109/MSE.2011.5937088
  • Filename
    5937088