A system containing an ambient light and a proximity sensor with intrinsic ambient light rejection

Author

Sant, L. ; Torta, P. ; Fant, A. ; Dorrer, L.

Author_Institution

Infineon Technol. Austria AG, Villach, Austria

fYear

2012

fDate

17-21 Sept. 2012

Firstpage

97

Lastpage

100

Abstract

A system for measuring ambient light as well as proximity of a reflective object is presented. A new technique of ambient light disturbance cancellation in proximity mode is proposed, enabling high accuracy measurements over a wide range of backlight. The chip, built in a 0.25μm CMOS technology, is capable of measuring ambient light intensities with a resolution better than 0.25lx at a 16klx full-scale and a reflected proximity IR signal with amplitude down to 200pA, rejecting backlight variations from 0 to 100μA.

Keywords

CMOS image sensors; infrared detectors; optical sensors; optical variables measurement; photometers; proximity effect (lithography); CMOS technology; ambient light; ambient light disturbance cancellation; backlight; current 0 muA to 100 muA; current 200 pA; high accuracy measurements; intrinsic ambient light rejection; proximity IR signal reflection; proximity sensor; size 0.25 mum; Accuracy; Charge pumps; Current measurement; Demodulation; Mixers; Photodiodes; Semiconductor device measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

ESSCIRC (ESSCIRC), 2012 Proceedings of the

Conference_Location

Bordeaux

ISSN

1930-8833

Print_ISBN

978-1-4673-2212-6

Electronic_ISBN

1930-8833

Type

conf

DOI

10.1109/ESSCIRC.2012.6341265

Filename

6341265