DocumentCode
1979157
Title
Design and Test of InP DHBT ICs for a 100 Gb/s Demonstrator System
Author
Swahn, Thomas ; Hallin, Joakim ; Kjellberg, Torgil
fYear
2006
fDate
7-11 May 2006
Firstpage
79
Lastpage
84
Keywords
Bit rate; Electronic equipment testing; Indium phosphide; Instruments; Integrated circuit testing; Manufacturing; Microwave technology; System testing; Telecommunication traffic; Time division multiplexing;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials Conference Proceedings, 2006 International Conference on
Print_ISBN
0-7803-9558-1
Type
conf
DOI
10.1109/ICIPRM.2006.1634116
Filename
1634116
Link To Document