• DocumentCode
    1980554
  • Title

    Investigations on oxide-free InGaAlAs waveguides grown by narrow stripe selective MOVPE

  • Author

    Feng, W. ; Pan, J.Q. ; Zhou, F. ; Zhao, L.J. ; Zhu, H.L. ; Wang, W.

  • Author_Institution
    Inst. of Semicond., Chinese Acad. of Sci., Beijing
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    305
  • Lastpage
    308
  • Abstract
    Oxide-free InGaAlAs waveguides have been grown on the InP substrates patterned with pairs of SiO2 mask stripes using narrow stripe selective MOVPE. The mask stripe width is varied from 0 to 40 mum, while the window region width between a pair of mask stripes is fixed at 1.5, 2.5 and 3.5 mum, respectively. Smooth surfaces and flat interfaces are obtained in the selectively grown InGaAlAs waveguides. There exhibit strong dependences of the thickness enhancement ratio and the photoluminescence (PL) spectrum on the mask stripe width and the window region width for the InGaAlAs waveguides. A large PL peak wavelength shift of 79 nm and a PL full width of at half maximum (FWHM) of less than 64 meV are obtained simultaneously. Some possible interpretations for our investigations are presented by considering both the migration effect from a masked region (MMR) and the lateral vapor diffusion effect (LVD)
  • Keywords
    III-V semiconductors; MOCVD; aluminium compounds; diffusion; gallium arsenide; indium compounds; interface structure; masks; optical waveguides; photoluminescence; semiconductor epitaxial layers; semiconductor growth; silicon compounds; spectral line breadth; surface topography; vapour phase epitaxial growth; 0 to 40 mum; 1.5 mum; 2.5 mum; 3.5 mum; FWHM; InGaAlAs; InP substrates; InP-SiO2; SiO2 mask; flat interface; full width of at half maximum; lateral vapor diffusion effect; mask stripe width; masked region; migration effect; narrow stripe selective MOVPE; oxide-free InGaAlAs waveguides; photoluminescence; selectively grown InGaAlAs waveguides; smooth surface; stripe surface pattern; thickness enhancement ratio; wavelength shift; window region width; Epitaxial growth; Epitaxial layers; Etching; Indium phosphide; Optical device fabrication; Optical materials; Optical waveguides; Plasma temperature; Semiconductor waveguides; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials Conference Proceedings, 2006 International Conference on
  • Conference_Location
    Princeton, NJ
  • Print_ISBN
    0-7803-9558-1
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2006.1634176
  • Filename
    1634176