DocumentCode
1982128
Title
An Integrated Scattering- and Noise Parameter Measurement System
Author
Beuwer, W.A.M.
Author_Institution
Twente University of Technology, EL/Microwave Department, P.O. Box 217, 7500 AE ENSCHEDE (Netherlands)
fYear
1981
fDate
7-11 Sept. 1981
Firstpage
627
Lastpage
632
Abstract
By addition of noise measuring equipment to an existing semi-automatic Network Analyser System, Scattering and Noise Parameters of linear two-ports can now accurately be measured in a relative easy and fast way, over a frequency band from 1,8 - 18 GHz. To reach this goal an HP9845B desktop computer is used to guide the operator, control the equipment, gather and correct the data and present the results. Essential for the broadband noise parameter measurements is a computer controlled, stepper-motor driven, coaxial slide screw-tuner. A block-diagram of the whole system, that is placed in a temperature stabilized room (22 ± l°C), is given in fig. 4.
Keywords
Circuit noise; Frequency measurement; Harmonic analysis; Impedance measurement; Noise measurement; Scattering parameters; Signal analysis; Signal to noise ratio; Temperature; Tuners;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1981. 11th European
Conference_Location
Amsterdam, Netherlands
Type
conf
DOI
10.1109/EUMA.1981.332917
Filename
4131686
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