• DocumentCode
    1982128
  • Title

    An Integrated Scattering- and Noise Parameter Measurement System

  • Author

    Beuwer, W.A.M.

  • Author_Institution
    Twente University of Technology, EL/Microwave Department, P.O. Box 217, 7500 AE ENSCHEDE (Netherlands)
  • fYear
    1981
  • fDate
    7-11 Sept. 1981
  • Firstpage
    627
  • Lastpage
    632
  • Abstract
    By addition of noise measuring equipment to an existing semi-automatic Network Analyser System, Scattering and Noise Parameters of linear two-ports can now accurately be measured in a relative easy and fast way, over a frequency band from 1,8 - 18 GHz. To reach this goal an HP9845B desktop computer is used to guide the operator, control the equipment, gather and correct the data and present the results. Essential for the broadband noise parameter measurements is a computer controlled, stepper-motor driven, coaxial slide screw-tuner. A block-diagram of the whole system, that is placed in a temperature stabilized room (22 ± l°C), is given in fig. 4.
  • Keywords
    Circuit noise; Frequency measurement; Harmonic analysis; Impedance measurement; Noise measurement; Scattering parameters; Signal analysis; Signal to noise ratio; Temperature; Tuners;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1981. 11th European
  • Conference_Location
    Amsterdam, Netherlands
  • Type

    conf

  • DOI
    10.1109/EUMA.1981.332917
  • Filename
    4131686