DocumentCode :
1984303
Title :
A 2.5GS/s 3-bit time-based ADC in 90nm CMOS
Author :
Macpherson, Andrew R. ; Townsend, Kenneth A. ; Haslett, J.W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Calgary, Calgary, AB, Canada
fYear :
2011
fDate :
15-18 May 2011
Firstpage :
9
Lastpage :
12
Abstract :
This paper describes the first gigasample rate time-based Nyquist analog-to-digital converter (ADC), consisting of a voltage-to-time-converter (VTC) followed by a time-to-digital- converter (TDC). After tuning, the 3-bit 2.5GS/s ADC designed in 90nm CMOS is measured to have an effective number of bits (ENOB) greater than 2.1 up to the Nyquist frequency. The power consumption, not including the TDC output drivers, is 12.1 mW.
Keywords :
CMOS integrated circuits; analogue-digital conversion; circuit tuning; low-power electronics; CMOS integrated circuit; Nyquist analog-to-digital converter; first gigasample rate; power 12.1 mW; power consumption; size 90 nm; time-based ADC; time-to-digital-converter; tuning; voltage-to-time-converter; CMOS integrated circuits; Clocks; Delay; Histograms; Inverters; Jitter; Noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
Conference_Location :
Rio de Janeiro
ISSN :
0271-4302
Print_ISBN :
978-1-4244-9473-6
Electronic_ISBN :
0271-4302
Type :
conf
DOI :
10.1109/ISCAS.2011.5937488
Filename :
5937488
Link To Document :
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