• DocumentCode
    1985204
  • Title

    Micro Ion-Optical Systems Technology [MIST] for Mass Spectrometry Using PCBMEMS

  • Author

    Fries, David ; Ivanov, Stan ; Broadbent, Heather ; Willoughby, Ross ; Sheehan, Ed

  • Author_Institution
    Univ. of South Florida, St. Petersburg
  • fYear
    2007
  • fDate
    4-7 June 2007
  • Firstpage
    3278
  • Lastpage
    3281
  • Abstract
    Within the traditional mass spec instrumentation field there is ongoing interest in new atmospheric ion source designs for more effective and versatile ion generation. The objective of the present study is to apply organic MEMS microfabrication technologies to generation of atmospheric pressure ion optical devices. We have devised novel materials, processes, and designs for micro ion optical systems for control of ions within sources, and across apertures and conductance arrays. PCBMEMS using LCP have been used in the construction of the devices. Vacuum compatibility of the polymeric material has been found to be similar to glass in performance characteristics. Processes for shaping the polymer dielectric for fluid flow control and the metallization for electrical field control have been devised. Different geometries, both tubular and planar, combined with electrical field shaping circuitry and fluidic flow control networks are part of the effort.
  • Keywords
    ion optics; mass spectroscopy; micromechanical devices; PCBMEMS; electrical field control; fluid flow control; mass spectrometry; micro ion optical systems technology; polymer dielectric; vacuum compatibility; Conducting materials; Fluid flow control; Instruments; Ion sources; Liquid crystal polymers; Mass spectroscopy; Optical arrays; Optical control; Optical materials; Shape control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2007. ISIE 2007. IEEE International Symposium on
  • Conference_Location
    Vigo
  • Print_ISBN
    978-1-4244-0754-5
  • Electronic_ISBN
    978-1-4244-0755-2
  • Type

    conf

  • DOI
    10.1109/ISIE.2007.4375140
  • Filename
    4375140